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While pursuing the goal of turning a cloud of ultracold atoms into a completely new kind of circuit element, physicists at the National Institute of Standards
Piezoelectrics—materials that can change mechanical stress to electricity and back again—are everywhere in modern life. Computer hard drives. Loud speakers
WASHINGTON, DC – The President today will announce new steps with the private sector to strengthen the manufacturing sector, boost advanced manufacturing, and
Material Measurement Laboratory researcher R. Joseph Kline was recently named among the 102 recipients of the Presidential Early Career Awards for Scientists
Computer security systems may one day get a boost from quantum physics, as a result of recent research from the National Institute of Standards and Technology
A team of researchers at NIST's Antenna Metrology Lab in Boulder, CO has devised a first-of-its-kind system – combining a precision 3-meter industrial robot arm
Researchers from the National Institute of Standards and Technology (NIST) have joined with an international team to engineer and measure a potentially
Additional Contact: Juliana Gruenwald, NTIA, 202-482-2145 WASHINGTON – The U.S. Commerce Department's National Telecommunications and Information Administration
By adapting superconducting technology used in advanced telescope cameras, researchers at the National Institute of Standards and Technology (NIST) have built a
Many in the electronics industry want to change how memories are made. So PML scientists are exploring the physics and developing the metrology required to do
A fundamental advance in measurement capabilities that could save semiconductor manufacturers billions of dollars annually has earned a 2013 R&D 100 Award for
A technique developed several years ago at the National Institute of Standards and Technology (NIST) for improving optical microscopes now has been applied to
Guest blog post by Patrick Gallagher, Under Secretary of Commerce for Standards and Technology and Director, National Institute of Standards and Technology Just
Using a powerful combination of microanalytic techniques that simultaneously image photoelectric current and chemical reaction rates across a surface on a
As device manufacturing technologies sizes shrink beyond 22 nm and increase in complexity, defects become more detrimental to device performance and harder to
An international collaboration led by researchers from the NIST Center for Nanoscale Science and Technology (CNST) has demonstrated a novel temporal filtering
Continued advancements using a NIST-developed molecular-level fabrication technique are leading to new discoveries in the metrology for molecular electronics by
Researchers at the National Institute of Standards and Technology (NIST) have developed a new microscope able to view and measure an important but elusive
Since the inception of the scanning electron microscope (SEM), users have encountered the persistent problem of contamination. Cleanliness is required for
How the semiconductor industry can create the next generations of nanoscale computing technology will be one of the themes of the 2013 International Conference
A single photon may not seem like much of a catch. But detecting photons one-by-one with near-perfect reliability is formidably difficult. It is also an
The electrical power industry – and the equipment makers and calibration laboratories that serve it – need to be able to quantify DC currents of hundreds or
An international collaboration led by researchers from the NIST Center for Nanoscale Science and Technology has demonstrated the ability to make photons emitted
Researchers in the Semiconductor and Dimensional Metrology Division's Nanoelectronic Device Metrology (NEDM) Project have demonstrated the first documented case