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NIST Interagency/Internal Report (NISTIR)

Technology Readiness Levels for Randomized Bin Picking, Performance Metrics for Intelligent Systems (PerMIS) 2012 Workshop, Special Session

Author(s)
Jeremy Marvel, Roger D. Eastman, Geraldine S. Cheok, Kamel S. Saidi, Tsai H. Hong, Elena R. Messina, Bob Bollinger, Paul Evans, Joyce Guthrie, Eric Hershberger, Carlos Martinez, Karen McNamara, James Wells
The special session on Technology Readiness Levels (TRLs) for Randomized Bin Picking was held during the morning session of the 2012 Performance Metrics for

Bridging Analog LMR to LTE MCPTT Communications

Author(s)
Christopher J. Walton, Chic J. O'Dell
This paper explores a low-cost method to bridge analog public safety Land mobile radio (LMR) systems into a standards based Long Term Evolution (LTE) MCPTT

NIST Scientific Foundation Reviews

Author(s)
John M. Butler, Hariharan K. Iyer, Richard A. Press, Melissa Taylor, Peter Vallone, Sheila Willis
The National Institute of Standards and Technology (NIST) is a scientific research agency that works to advance measurement science, standards, and technology

An Integrated Set of XML Tools – User Guide

Author(s)
Thomas R. Kramer, Zeid Kootbally, Craig Schlenoff
This user guide describes an integrated set of C++ software tools for manipulating XML (eXtensible Markup Language) schemas and XML instance files. The tools

2018 Media Forensics Challenges (MFC18): Summary and Results

Author(s)
Yooyoung Lee, Amy Yates, Haiying Guan, Jonathan G. Fiscus, Daniel Zhou
The interest of forensic techniques capable of detecting many different manipulation types has been growing, and system developments with machine learning

Cybersecurity Framework Version 1.1 Manufacturing Profile

Author(s)
Keith A. Stouffer, Timothy Zimmerman, CheeYee Tang, Michael Pease, Jeffrey Cichonski, John McCarthy
This document provides the Cybersecurity Framework (CSF) Version 1.1 implementation details developed for the manufacturing environment. The "Manufacturing

Reliable, High-Performance Wireless Systems for Factory Automation

Author(s)
Kang B. Lee, Rick Candell, Hans-Peter Bernhard, Dave Cavalcanti, Zhibo Pang, Inaki Val
Wireless has emerged as an enabling technology to improve operational flexibility and efficiency for factory automation. The latest wireless technology

NIST Cloud Computing Forensic Science Challenges

Author(s)
Martin Herman, Michaela Iorga, Ahsen Michael Salim, Robert H. Jackson, Mark R. Hurst, Ross Leo, Richard Lee, Nancy Landreville, Anand K. Mishra, Yien Wang, Rodrigo Sardinas
This document summarizes research performed by the members of the NIST Cloud Computing Forensic Science Working Group and aggregates, categorizes, and discusses