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Special Publication (NIST SP)

Guide to Computer Security Log Management

Author(s)
Karen A. Scarfone, Murugiah Souppaya
The National Institute of Standards and Technology (NIST) developed this document in furtherance of its statutory responsibilities under the Federal Information

Guidelines for Media Sanitization

Author(s)
Richard L. Kissel, Matthew A. Scholl, Steven Skolochenko, Xiang Li
Information systems capture, process, and store information using a wide variety of media. This information is located not only on the intended storage media

PIV Data Model Test Guidelines

Author(s)
Ramaswamy Chandramouli, Ketan Mehta, Pius A. Uzamere, Davie Simon, Nabil Ghadiali, Andrew P. Founds
In order to build the necessary PIV infrastructure to support common unified processes and government-wide use of identity credentials, NIST developed this test

Proceedings of the Static Analysis Summit

Author(s)
Paul E. Black, Helen Gill, W. E. Martin, Elizabeth N. Fong
This is the proceeding of a summit held in June 2006 at the National Institute of Standards and Technology (NIST). This Static Analysis Summit is one of a

Certification of SRM 114q: Part II

Author(s)
Chiara F. Ferraris, Max A. Peltz, William F. Guthrie, A Aviles, Robin K. Haupt, Bruce S. MacDonald
The standard reference material (SRM) for fineness of cement, SRM 114, is an integral part of the calibration material routinely used in the cement industry to

Certification of SRM 114q: Part I

Author(s)
Chiara F. Ferraris, William F. Guthrie, A Aviles, Robin K. Haupt, Bruce S. MacDonald
The standard reference material (SRM) for fineness of cement, SRM 114, is an integral part of the calibration material routinely used in the cement industry to

Overview of TREC 2005

Author(s)
Ellen M. Voorhees
The fourteenth Text REtrieval Conference, TREC 2005, was held at the National Institute of Standards and Technology (NIST) November 15--18, 2005. The conference

NIST Measurement Services: Specular Gloss

Author(s)
Maria E. Nadal, E A. Early, E A. Thompson
This document describes the instrumentation, standards, and measurement techniques used at the National Institute of Standards and Technology (NIST) to measure

Composition Standards for AlGaAs Epitaxial Layers

Author(s)
Kristine A. Bertness, Todd E. Harvey, C. M. Wang, Albert J. Paul, Larry Robins
Standard Reference Materials (SRMs) 2840 to 2843 are semiconductor material artifacts that consist of an epitaxial layer of AlxGa (1-x)As on a GaAs substrate