An Approach to T-way Test Sequence Generation With Constraints

Published

April 22, 2019

Author(s)

Raghu N. Kacker, David R. Kuhn

Abstract

In this paper we address the problem of constraint handling in t-way test sequence generation. We develop a notation for specifying sequencing constraints and present a t-way test sequence generation that handles the constraints specified in this notation. We report a case study in which we applied our notation and test generation algorithm to a real-life communication protocol. Our experience indicates that our notation is intuitive to use and allows us to express important sequencing constraints for the protocol. However, the test generation algorithm takes a significant amount of time. This work is part of our larger effort to make t- way sequence testing practically useful.

Proceedings Title

Proceedings of IEEE International Conference on Software Testing, Verification and Validation
ICST 2019 Workshops

Conference Dates

April 22-27, 2019

Conference Location

Xian

Conference Title

IEEE International Conference on Software Testing, Verification and Validation
ICST 2019

Pub Type

Conferences

Download Paper

https://doi.org/10.1109/ICSTW.2019.00059.

Local Download

Keywords

Test Sequence Generation, Sequencing Constraint, T-way Sequence Coverage, Sequence Testing, Event-based Testing, Combinatorial Testing

Citation

Kacker, R. and Kuhn, D. (2019), An Approach to T-way Test Sequence Generation With Constraints, Proceedings of IEEE International Conference on Software Testing, Verification and Validation ICST 2019 Workshops, Xian, -1, [online], https://doi.org/10.1109/ICSTW.2019.00059. (Accessed March 19, 2025)