Wilson, C.
and Blue, J.
(1985),
MOS1 a program for two-dimensional analysis of Si MOSFETs:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.SP.400-77
(Accessed November 8, 2024)
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MOS1 a program for two-dimensional analysis of Si MOSFETs:
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- NBS SP 400-77
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NBS SP 400-77
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NIST Pubs
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Created January 1, 1985, Updated May 19, 2023