Thurber, W.
, Phillips, W.
and Larrabee, R.
(1982),
Measurement techniques for high power semiconductor materials and devices ::annual report, October 1, 1980 to December 31, 1981, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.82-2552
(Accessed November 8, 2024)
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Measurement techniques for high power semiconductor materials and devices ::annual report, October 1, 1980 to December 31, 1981
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- NBS IR 82-2552
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NBS IR 82-2552
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NIST Pubs
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Created January 1, 1982, Updated May 19, 2023