Marshall, J.
and Mattis, R.
(1992),
Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.SP.400-90
(Accessed November 8, 2024)
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Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2:
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- NIST SP 400-90
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NIST SP 400-90
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NIST Pubs
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Created January 1, 1992, Updated May 20, 2023