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PUBLICATIONS

Advanced Characterization of Materials using Atom Probe Tomography

Published

Author(s)

Jacob Garcia, Ann Chiaramonti Debay

Abstract

No abstract required for this submission
Citation
Electronic Device Failure Analysis magazine
Volume
26
Issue
1
Pub Type
Others

Download Paper

Local Download
Superconducting electronics, Nanoelectronics, Materials characterization and Analytical chemistry

Citation

Garcia, J. and Chiaramonti Debay, A. (2024), Advanced Characterization of Materials using Atom Probe Tomography, Electronic Device Failure Analysis magazine, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936728 (Accessed December 26, 2024)

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Created February 1, 2024, Updated February 12, 2024