Kim, D.
, Okamoto, K.
, Goldner, L.
and Hwang, J.
(2006),
Characterization of single functionalized quantum dots using combined atomic force and confocal fluorescence microscopy, SPIE
(Accessed March 13, 2025)
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Characterization of single functionalized quantum dots using combined atomic force and confocal fluorescence microscopy
Published
Author(s)
D S. Kim, K Okamoto, ,
Citation
SPIE
Volume
6096
Pub Type
Journals
Citation
Issues
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Created December 31, 2005, Updated October 12, 2021