Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Effect of interfaces and adhesion on the creep compliance of thin polymer coatings

Published

Author(s)

Peter M. Johnson, John A. Howarter, Christopher Stafford

Abstract

Thin film indentation experiments on viscoelastic materials allowed for the deconvolution of the bulk compliance from interfacial responses at the buried interface. This technique could discriminate both large changes in the interfacial strength due to different chemical moieties and interfaces with varying densities of multiple chemical moieties. Indentation results correlated with cantilever peel measurements, with systems showing limited interfacial relaxations having higher fracture toughness. While the interfacial strength can be measured through techniques which cause complete separation of the interface, this indentation technique provided time-dependent results and does not cause delamination of the polymer film. More complex geometries and interactions can be explored with further modifications to the polymer-glass interface, providing a route to study and design robust interfacial regions for improved performance.
Proceedings Title
Adhesion Society Extended Abstracts
Conference Dates
February 13-16, 2011
Conference Location
Savannah, GA, US
Conference Title
2011 Annual Meeting of the Adhesion Society

Keywords

creep, thin film, polymer, adhesion, compliance, indentation

Citation

Johnson, P. , Howarter, J. and Stafford, C. (2011), Effect of interfaces and adhesion on the creep compliance of thin polymer coatings, Adhesion Society Extended Abstracts, Savannah, GA, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907511 (Accessed December 26, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created February 12, 2011, Updated October 14, 2021