Randa, J.
(2008),
Uncertainty Analysis for Noise-Parameter Measurements, CPEM 2008, Broomfield, CO, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32904
(Accessed January 2, 2025)
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Uncertainty Analysis for Noise-Parameter Measurements
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Abstract
A brief summary is presented for the uncertainty analysis for measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the noise correlation matrix, and the traditional IEEE noise parameters.Proceedings Title
CPEM 2008
Conference Dates
June 8-13, 2008
Conference Location
Broomfield, CO
Conference Title
Conference on Precision Electromagnetic Measurements
Pub Type
Conferences
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Created June 8, 2008, Updated January 27, 2020