ITS-90 Calibration of Radiation Thermometers for RTP Using Wire/Thin-Film Thermocouples on a Wafer

Published

June 1, 2001

Author(s)

Christopher W. Meyer, D P. DeWitt, Kenneth G. Kreider, Francis J. Lovas, Benjamin K. Tsai

Abstract

Light-pipe radiation thermometers (LPRTs) are the sensor system of choice in RTP tools. They can be calibrated against blackbodies with an uncertainty (k=1) less than 0.3 C. In an RTP tool, however, account must be made for wafer emissivity and wafer-chamber interreflections, or else temperature measurement uncertainties will be orders of magnitude higher. We have used two complementary approaches for accomplishing this: 1) in situ calibration using high-accuracy wire/thin-film thermocouples calibrated on the International Temperature Scale of 1990 (ITS-90) and 2) developing optical models to estimate the effective emissivity of the wafer eeff when used in the radiation environment of the RTP tool. The temperature measurement uncertainty of LPRTs using either technique is 2.1 C or less.

Proceedings Title

Characterization and Metrology for ULSI Technology, International Conference | | | American Institute of Physics

Volume

No. 550

Conference Dates

June 1, 2000

Conference Title

AIP Conference Proceedings

Pub Type

Conferences

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Keywords

ITS-90, Light Pipe Radiation Thermometers, Rapid Thermal Processing, Thin Film Thermocouples

Citation

Meyer, C. , DeWitt, D. , Kreider, K. , Lovas, F. and Tsai, B. (2001), ITS-90 Calibration of Radiation Thermometers for RTP Using Wire/Thin-Film Thermocouples on a Wafer, Characterization and Metrology for ULSI Technology, International Conference | | | American Institute of Physics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=830687 (Accessed January 15, 2025)