Weil, C.
(1995),
The NIST Metrology Program on Electromagentic Characterization of Materials, Proc., Symp. on Materials and Processes for Wireless Communication, Boston, MA
(Accessed December 21, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
The NIST Metrology Program on Electromagentic Characterization of Materials
Published
Author(s)
Proceedings Title
Proc., Symp. on Materials and Processes for Wireless Communication
Conference Dates
November 15-16, 1995
Conference Location
Boston, MA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created November 1, 1995, Updated February 19, 2017