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PUBLICATIONS

Resistance-Based Scaling of LF-and MF-Band Thermal Noise Powers

Published

Author(s)

John Labenski, Weston L. Tew, Sae Woo Nam, Samuel P. Benz, Paul D. Dresselhaus, Charles J. Burroughs

Abstract

A conventional technique for scaling thermal noise power in Johnson Noise Thermometry (JNT) is via resistance ratios. We describe measurements in the low to medium frequency (LF/MF) bands using this approach via correlation methods in the frequency domain. We show that the effects of the mismatch in time constants of the input networks may be empirically treated to extract the noise power ratio in the low frequency limit with uncertainties ~60 mK/K.
Citation
IEEE Transactions on Instrumentation and Measurement
Volume
56
Issue
2
Pub Type
Journals

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Keywords

ITS-90, JNT, Johnson NoiseThermometry, noise thermometry, resistance ratios, spectral noise power, temperature
Thermometry metrology

Citation

Labenski, J. , Tew, W. , Nam, S. , Benz, S. , Dresselhaus, P. and Burroughs, C. (2007), Resistance-Based Scaling of LF-and MF-Band Thermal Noise Powers, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=830971 (Accessed December 22, 2024)

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Created April 1, 2007, Updated February 19, 2017