Souders, T.
and Stenbakken, G.
(1991),
Cutting the High Cost of Testing, Spectrum (IEEE, New York, NY), [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=17246
(Accessed December 15, 2024)
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Cutting the High Cost of Testing
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Created February 28, 1991, Updated October 12, 2021