Kelley, E.
(1999),
Flat Panel Display Metrology -- Less than Meets the Eye, Proc. 1999 National Conference of Standards Laboratories Workshop and Symposium (NCSL), Charlotte, NC, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=5933
(Accessed January 13, 2025)
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Flat Panel Display Metrology -- Less than Meets the Eye
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Author(s)
Abstract
Accurate measurement of electronic displays has become important in recent years owing to the advances in flat panel display technologies. A well-defined language is needed to specify, evaluate, and compare display technologies and their suitability to tasks. Such a specification language depends upon an unambiguous metrology being firmly in place to provide a level playing field. We will review some of the unanticipated complications that have arisen in simple measurements such as contrast as well as more complicated measurements such as display reflection properties.Proceedings Title
Proc. 1999 National Conference of Standards Laboratories Workshop and Symposium (NCSL)
Conference Dates
July 11-15, 1999
Conference Location
Charlotte, NC
Pub Type
Conferences
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Keywords
contrast, display measurements, FPD metrology, flat panel displays, reflection, veiling glare
Citation
Issues
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Created July 1, 1999, Updated February 19, 2017