Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Significant Parameters in the Optimization of MALDI-TOF-MS

Published

Author(s)

S Wetzel, Kathleen M. Flynn, James J. Filliben

Abstract

One of the most significant issues in any analytical technique is optimization. Optimization and calibration are key factors in quantitation. In matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS), one of the limitations restricting quantitation is instrument optimization. Understanding which parameters are most influential and the effects of these parameters on the mass spectrum is required for optimization. This understanding is especially important when characterizing synthetic polymers by MALDI-TOF-MS, due to the complex nature of synthetic polymers. Several instrument parameters were studied using an orthogonal experimental design to understand effects on the signal-to-noise of a polystyrene distribution. The parameters examined included; laser energy, detector voltage, is/2 voltage, lens voltage and delay time. Other factors considered were polymer concentration and matrix. Detector voltage and delay time were the most influential of the instrument parameters for polystyrene.
Proceedings Title
Sigma Xi Postdoctoral Poster Presentations, 2004
Conference Dates
February 19-20, 2004
Conference Location
Undefined

Keywords

MALDI-TOF-MS, optimization, parameters, significant

Citation

Wetzel, S. , Flynn, K. and Filliben, J. (2004), Significant Parameters in the Optimization of MALDI-TOF-MS, Sigma Xi Postdoctoral Poster Presentations, 2004, Undefined (Accessed December 13, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 31, 2004, Updated October 12, 2021