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Surface Analysis Studies of Yield Enhancements in Secondary Ion Mass Spectrometry by Polyatomic Projectiles

Published

Author(s)

E Fuoco, G Gillen, M B. Wijesundara, William E. Wallace, L Hanley
Citation
Journal of Physical Chemistry B
Volume
105(18)

Keywords

Scattering, Spectroscopy, cluster bombardment, polyatomic ion bombardment, secondary ion mass spectrometry, sputter yield

Citation

Fuoco, E. , Gillen, G. , Wijesundara, M. , Wallace, W. and Hanley, L. (2001), Surface Analysis Studies of Yield Enhancements in Secondary Ion Mass Spectrometry by Polyatomic Projectiles, Journal of Physical Chemistry B, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853757 (Accessed January 8, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 2000, Updated October 12, 2021