Kaplan, S.
and Hanssen, L.
(1999),
FT-IR Based Ellipsometer Using High-Quality Brewster-Angle Polarizers, Conference Polarization: Measurement, Analysis and Remote Sensing II , Volume: 3754 Pages: 285-293, HU
(Accessed November 8, 2024)
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FT-IR Based Ellipsometer Using High-Quality Brewster-Angle Polarizers
Published
Author(s)
,
Proceedings Title
Conference Polarization: Measurement, Analysis and Remote Sensing II
Conference Location
Volume: 3754 Pages: 285-293, HU
Conference Title
Proc. SPIE Conference Polarization: Measurement, Analysis and Remote Sensing II
Pub Type
Conferences
Citation
Issues
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Created January 1, 1999, Updated February 17, 2017