Germer, T.
and Scheer, B.
(1998),
Polarization of out-of-plane optical scatter from SiO<sub>2</sub> films grown on photolithographically-generated microrough silicon, ed. by Z.H. Gu and A.A. Maradudin, Scattering and Surface Roughness II SPIE
(Accessed July 18, 2024)
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Polarization of out-of-plane optical scatter from SiO2 films grown on photolithographically-generated microrough silicon, ed. by Z.H. Gu and A.A. Maradudin
Published
Author(s)
, B W. Scheer
Citation
Scattering and Surface Roughness II SPIE
Volume
3426
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 1998, Updated February 17, 2017