Jeanneret, B.
, Rufenacht, A.
and Burroughs, C.
(2001),
Comparison Between the SNS and SIS Josephson Voltage Standards at OFMET, IEEE Transactions on Instrumentation and Measurement
(Accessed July 18, 2024)
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Comparison Between the SNS and SIS Josephson Voltage Standards at OFMET
Published
Author(s)
Blaise Jeanneret, Alain Rufenacht,
Abstract
Recently, a new Josephson voltage standard based on a lV programmable chip provided by the National Institute of Standards and Technology (NIST) was impemented at the Swiss Federal Office of Metrology (OFMET). A comparison with a conventional Josephson voltage standard showed an agreement of 1.4 1 3.4 parts in 1010 at 1V. This result demonstrates the new system is functioning properly and can be used in various types of measurements. In particular, it will be one of the key component of the Watt balance experiment [1] that is presently under construction at OFMET.Citation
IEEE Transactions on Instrumentation and Measurement
Volume
50
Issue
2
Pub Type
Journals
Keywords
Josephson, SNS, voltage standards
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created March 31, 2001, Updated October 12, 2021