Lewis, R.
(1997),
Relative Permittivity Measurement of Rectangular Copper-Laminated Substrates Using the Full-Sheet Resonance Technique, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed July 21, 2024)
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Relative Permittivity Measurement of Rectangular Copper-Laminated Substrates Using the Full-Sheet Resonance Technique
Published
Author(s)
R L. Lewis
Citation
NIST Interagency/Internal Report (NISTIR) - 5062
Report Number
5062
Volume
5062
NIST Pub Series
Pub Type
NIST Pubs
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created March 31, 1997, Updated October 12, 2021