Williams, D.
, Arz, U.
and Grabinski, H.
(1998),
Accurate Characteristic Impedance Measurement on Silicon, Tech. Dig., IEEE MTT-S International Microwave Symposium, Baltimore, MD, [online], https://doi.org/10.1109/MWSYM.1998.700955
(Accessed December 15, 2024)
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Accurate Characteristic Impedance Measurement on Silicon
Published
Author(s)
, , Hartmut Grabinski
Abstract
This paper presents a new method that accurately determines the characteristic impedance of planar transmission lines printed on lossy dielectrics even when contact-pad capacitance and conductance are large. We demonstrate the method on a coplanar waveguide fabricated on fused silica and a microstrip line fabricated on a highly conductive silicon substrate.Proceedings Title
Tech. Dig., IEEE MTT-S International Microwave Symposium
Volume
3
Conference Dates
June 7-12, 1998
Conference Location
Baltimore, MD
Pub Type
Conferences
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Citation
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Created June 1, 1998, Updated November 10, 2018