Hurley, D.
, Yuya, P.
and Turner, J.
(2008),
Contact resonance atomic force microscopy for viscoelasticity, Journal of Applied Physics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854070
(Accessed January 2, 2025)
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Contact resonance atomic force microscopy for viscoelasticity
Published
Author(s)
, Philip Yuya, J Turner
Abstract
We present a quantitative method for determining the viscoelastic properties of materials with nanometer spatial resolution. The approach is based on the atomic force acoustic microscopy (AFAM) technique that involves the resonant frequencies of the AFM cantilever when its tip is in contact with a sample surface. We derive expressions for the sample's visoelastic properties in terms of the cantilever's frequency response and damping losses. We demonstrate the approach by obtaining experimental values for the storage and loss moduli of a poly methyl methacrylate (PPMA) film using a polystyrene sample as a reference material. Experimental techniques and system calibration methods to perform materials-property measurements are also presented.Citation
Journal of Applied Physics
Volume
104
Pub Type
Journals
Download Paper
Keywords
viscoelastic properties, contact-resonance AFM, polymers
Citation
Issues
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Created October 15, 2008, Updated February 19, 2017