Podia, F.
(1991),
Development of a Testing Methodology to Predict Optical Disk Life Expectancy Values, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed December 30, 2024)
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Development of a Testing Methodology to Predict Optical Disk Life Expectancy Values
Published
Author(s)
F L. Podia
Citation
Special Publication (NIST SP) - 500-200
Report Number
500-200
NIST Pub Series
Pub Type
NIST Pubs
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 1, 1991, Updated October 16, 2008