Vogt, B.
, Lee, V.
, Wu, W.
and Liu, Y.
(2005),
Specular X-Ray Reflectivity and Small Angle Neutron Scattering for Structure Determination of Ordered Mesoporous Dielectric Films, Journal of Physical Chemistry B, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853985
(Accessed July 17, 2024)
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Specular X-Ray Reflectivity and Small Angle Neutron Scattering for Structure Determination of Ordered Mesoporous Dielectric Films
Published
Author(s)
, V. J. Lee, , Yiping Liu
Citation
Journal of Physical Chemistry B
Volume
109
Pub Type
Journals
Download Paper
Keywords
Reflectivity, Scattering, Thin Films, reflectivity, small angle neutron scattering, thin films
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 2005, Updated February 17, 2017