Direct Imaging of Highly Charged Ions in an Electron Beam Ion Trap

Published

August 1, 2000

Author(s)

James V. Porto, I Kink, John D. Gillaspy

Abstract

We have directly observed the ion cloud distribution in an electron beam ion trap using visible and ultraviolet fluorescence from lines in the ground term of Ar¹³⁺,^ Xe³¹⁺ and Xe³²⁺ ions. Using a gated intensified charge coupled device camera, we have the capability to measure both static and dynamic ion cloud distributions. The images provide infromation about the trapped highly charged ions which is difficult to obtain by other methods. To demonstrate the usefulness of the technique, We took images of static ion clouds under different conditions and compared the distributions to a simple model. We also recorded time resolved images which show that we can monitor the relaxation of the ion cloud toward equilibrium when the trapping conditions are suddenly changed. The information provided by such measurements can be used to improve models of ion cloud dynamics and, combined with modeling, these techniques can help improve measurements of atomic data using electron beam ion traps..

Citation

Review of Scientific Instruments

Volume

71

Issue

No. 8

Pub Type

Journals

Keywords

EBIT

Citation

Porto, J. , Kink, I. and Gillaspy, J. (2000), Direct Imaging of Highly Charged Ions in an Electron Beam Ion Trap, Review of Scientific Instruments (Accessed December 21, 2024)