Jacox, M.
and , J.
(2006),
Scanning Tunneling Microscope - Web Page, Electronic Publication, [online], https://www.nist.gov/pml/scanning-tunneling-microscope
(Accessed January 13, 2025)
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Scanning Tunneling Microscope - Web Page
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Abstract
The scanning tunneling microscope [STM] is widely used in both industrial and fundamental research to obtain atomic-scale images of metal surfaces. It provides a three-dimensional profile of the surface which is very useful for characterizing surface roughness, observing surface defects, and determining the size and conformation of molecules and aggregates on the surface. Several other recently developed scanning microscopies also use the scanning technology developed for the STM.Citation
Electronic Publication
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Keywords
absorption edge, database, total cross section, World Wide Web, x-ray cross section
Citation
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Created November 1, 2006, Updated June 14, 2017