X-Ray Spectroscopy of Trapped Ions With a Microcalorimeter on the NIST Electron Beam Ion Trap

Published

December 1, 2002

Author(s)

E Takacs, John D. Gillaspy, L P. Ratliff, K Makonyi, J M. Laming, E Silver, H. Schnopper, M Barbera, J. Beeman, E. E. Haller, N. Madden

Abstract

The electron beam ion trap (EBIT) was invented about 15 years ago. Judging from the wide range of experiments performed on the machine since its inception, EBITs have become one of the most successful devices to Produce, trap and study the structure and interactions of highly charged ions. Today, EBITs exist in several different laboratories around the world and are used in a variety of fields of research where multiply charged ions relevant. Recent astrophysical missions by NASA and ESA-targeting the x-ray wavelength range of the electromagnetic spectrum opened up a new direction for EBIT rgesearch. Efforts at two U.S. EBIT sites, the Livermore National Laboratory (LLNL) in Livermore and the National Institute of Standards and Technology (NIST) in Gaithersburg, have provided highly charged ion data for astrophysical applications. in this report, some of the recent NIST results are summarized.

Citation

NASA Laboratory Astrophysics Space Science Workshop

Pub Type

Journals

Keywords

astrophysics, electron beam ion trap, highly charged ions, plasma diagnostics, x-rays

Citation

Takacs, E. , Gillaspy, J. , Ratliff, L. , Makonyi, K. , Laming, J. , Silver, E. , Schnopper, H. , Barbera, M. , Beeman, J. , Haller, E. and Madden, N. (2002), X-Ray Spectroscopy of Trapped Ions With a Microcalorimeter on the NIST Electron Beam Ion Trap, NASA Laboratory Astrophysics Space Science Workshop (Accessed July 5, 2024)