Stroud, R.
and Scott, J.
(2000),
Valence Mapping of Particulate 3D-Transition Metal Oxides Using Energy-Filtered Transmission Electron Microscopy, Microscopy Society of America; Microscopy and Microanalysis 2000, Annual Meeting | 58th | | Springer
(Accessed November 8, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Valence Mapping of Particulate 3D-Transition Metal Oxides Using Energy-Filtered Transmission Electron Microscopy
Published
Author(s)
R M. Stroud, J H. Scott
Abstract
We demonstrate here the feasibility of valence mapping of particulate samples, and discuss the factors that limit quantitative data extraction from the maps. Three manganese oxide powder samples were characterized: a commercially obtained Mn2O3 powder; and two chemically synthesized cryptomelane K{Δ, Δ}MnO2 battery materials, one with 50 nm to 100nm grains,and one with 5nm x 10nm to 30nm rods.Proceedings Title
Microscopy Society of America; Microscopy and Microanalysis 2000, Annual Meeting | 58th | | Springer
Volume
6
Issue
Suppl. 2
Conference Dates
August 1, 2000
Conference Title
Microscopy and Microanalysis Society
Pub Type
Conferences
Keywords
EELS, electron microscopy, energy-filtered microscopy, TEM, valence mapping
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created August 1, 2000, Updated February 17, 2017