Dura, J.
, Pellegrino, J.
and Richter, C.
(1996),
X-Ray Reflectivity of Interface Roughness Correlated with Transport Properties of (AlGa)As/GaAs High Electron Mobility Transistor Devices, Applied Physics Letters
(Accessed July 17, 2024)
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X-Ray Reflectivity of Interface Roughness Correlated with Transport Properties of (AlGa)As/GaAs High Electron Mobility Transistor Devices
Published
Author(s)
, Joseph G. Pellegrino,
Citation
Applied Physics Letters
Volume
69
Issue
8
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created August 18, 1996, Updated October 12, 2021