Stahlbush, R.
, Campisi, G.
, McKitterick, J.
, Maszara, W.
, Roitman, P.
and Brown, G.
(1992),
Electron and Hole Trapping in Irradiated SIMOX, ZMR, and BESOI Buried Oxides, IEEE Transactions on Nuclear Science
(Accessed December 26, 2024)
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Electron and Hole Trapping in Irradiated SIMOX, ZMR, and BESOI Buried Oxides
Published
Author(s)
R. E. Stahlbush, G. J. Campisi, J. B. McKitterick, W. P. Maszara, , George A. Brown
Citation
IEEE Transactions on Nuclear Science
Volume
NS-39
Issue
6
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created November 30, 1992, Updated October 12, 2021