Vanzura, E.
and Kissick, W.
(1989),
Advances in NIST Dielectric Measurement Capability Using a Mode-Filtered Cylindrical Cavity, Tech. Dig., IEEE MTT-S International Microwave Symposium, Long Beach, CA
(Accessed December 30, 2024)
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Advances in NIST Dielectric Measurement Capability Using a Mode-Filtered Cylindrical Cavity
Published
Author(s)
E. J. Vanzura, W. A. Kissick
Proceedings Title
Tech. Dig., IEEE MTT-S International Microwave Symposium
Conference Dates
June 13-15, 1989
Conference Location
Long Beach, CA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created May 31, 1989, Updated October 12, 2021