Cresswell, M.
, Khera, D.
, Linholm, L.
and Schuster, C.
(1992),
A Directed-Graph Classifier of Semiconductor Wafer-Test Patterns, IEEE Transactions on Semiconductor Manufacturing
(Accessed July 27, 2024)
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A Directed-Graph Classifier of Semiconductor Wafer-Test Patterns
Published
Author(s)
, D. Khera, , C. E. Schuster
Citation
IEEE Transactions on Semiconductor Manufacturing
Volume
5
Issue
3
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created July 31, 1992, Updated October 12, 2021