Rochford, K.
, Kreger, S.
and West, J.
(1999),
Variation in Optical Disc Birefringence Measurements, Proc. Intl. Soc. for Optical Engineering (SPIE), Joint International Symposium on Optical Memory and Optical Data Storage 1999, Koloa, HI
(Accessed December 26, 2024)
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Variation in Optical Disc Birefringence Measurements
Published
Author(s)
, S. T. Kreger, John W. West
Proceedings Title
Proc. Intl. Soc. for Optical Engineering (SPIE), Joint International Symposium on Optical Memory and Optical Data Storage 1999
Volume
3864
Conference Dates
July 11-15, 1999
Conference Location
Koloa, HI
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created June 30, 1999, Updated October 12, 2021