Qadri, S.
and Pellegrino, J.
(1992),
Interface Roughness Studies of AlAs/GaAs Superlattices Using X-Ray Diffraction, Extended Abstract, Annual Report, National Synchrotron Light Source Proceedings, Upton, NY, USA
(Accessed January 28, 2025)
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Interface Roughness Studies of AlAs/GaAs Superlattices Using X-Ray Diffraction
Published
Author(s)
S. B. Qadri, Joseph G. Pellegrino
Proceedings Title
Extended Abstract, Annual Report, National Synchrotron Light Source Proceedings
Conference Location
Upton, NY, USA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 30, 1992, Updated October 12, 2021