Cole, E.
, Suehle, J.
, Peterson, K.
, Chaparala, P.
, Campbell, A.
, Snyder, E.
and Pierce, D.
(1995),
OBIC Analysis of Stressed, Thermally Isolated Polysilicon Resistors, Proc., 1995 International Reliability Physics Symposium, Las Vegas, NV, USA
(Accessed December 26, 2024)
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OBIC Analysis of Stressed, Thermally Isolated Polysilicon Resistors
Published
Author(s)
E. I. Cole, , K. A. Peterson, P Chaparala, A. N. Campbell, E. S. Snyder, D T. Pierce
Proceedings Title
Proc., 1995 International Reliability Physics Symposium
Conference Dates
April 3-6, 1995
Conference Location
Las Vegas, NV, USA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 30, 1995, Updated October 12, 2021