Tang, Y.
(2005),
Applications of Programmable Josephson Voltage Standard in Voltage Metrology, Proc. VI Semetro, Rio de Janeiro, BR, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31992
(Accessed December 26, 2024)
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Applications of Programmable Josephson Voltage Standard in Voltage Metrology
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Author(s)
Abstract
A new type of Josephson junction array using current biased voltage steps can provide highly stable and accurate voltages. The superior voltage stability of such a Josephson voltage standard has many applications in dc voltage metrology. This paper describes the working principle of the programmable Josephson voltage standard (PJVS) using this new array technology and few examples of its applications.Proceedings Title
Proc. VI Semetro
Conference Dates
September 21-23, 2005
Conference Location
Rio de Janeiro, BR
Conference Title
VI Semetro International Seminar on Electrical Metrology
Pub Type
Conferences
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Keywords
Josephson voltage standard comparison, programmable Josephson voltage standard (PJVS), uncertainty, voltage dissemination
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Created September 1, 2005, Updated January 27, 2020