Force-deflection characterization of individual carbon nanotubes attached to MEMS devices

Published

January 25, 2004

Author(s)

M Hartman, Paul Rice, Dudley Finch, G. D. Skidmore, Victor M. Bright

Abstract

Results are presented for in-situ manipulation, attachment, and mechanical testing of individual carbon nanotubes (CNTs) on MEMS devices. Nanotubes positioned onto polysilicon structures were permanently attached by electron beam deposition (EBD) "welding". This approach allows design of mechanical tests for nanotubes with commercially available MEMS processes. A tensile force of 2.4 +1- 0.2 mN was applied to the structure via an attached, individual CNT, producing device deflections measured in a scanning electron microscope. Based on atomic force microscopy of welds, the joint between the EBD material and MEMS surface supported a shear stress of 1.6 +1- 0.5 MPa. on measuring force-deflection curves for individual CNTs mounted on MEMS platforms. Nanotubes previously prepared on glass slides have been manipulated to the desired device site, permanently attached, pulled, and the resulting device deflections measured.

Proceedings Title

MEMS Tech. Dig.

Conference Dates

January 25-29, 2004

Conference Location

Maastricht, NL

Conference Title

Micro Electro Mechanical Systems, 2004. 17th IEEE International Conference (MEMS)

Pub Type

Conferences

Download Paper

https://doi.org/10.1109/MEMS.2004.1290613

Local Download

Keywords

carbon nanotubes, electron beam welding, mechanical properties, MEMS

Citation

Hartman, M. , Rice, P. , Finch, D. , Skidmore, G. and Bright, V. (2004), Force-deflection characterization of individual carbon nanotubes attached to MEMS devices, MEMS Tech. Dig., Maastricht, NL, [online], https://doi.org/10.1109/MEMS.2004.1290613, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50038 (Accessed December 22, 2024)