Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Full-Wave Analysis of Dielectric-Loaded Cylindrical Waveguides and Cavities Using a New Four-Port Ring Network

Published

Author(s)

Felipe Penaranda-foix, Michael D. Janezic, Jose M. Catala-Civera, Antoni J. Canos-Marin

Abstract

In this paper, a full-wave method for the electromagnetic analysis of dielectric-loaded cylindrical and coaxial waveguides and cavities is developed. For this purpose, a new four-port ring network is proposed, and the mode-matching method is applied to calculate the generalized admittance matrix of this new structure. A number of analyses on dielectric-loaded waveguide structures and cavities have been conducted in order to validate and to assess the accuracy of the new approach. The results have been compared with theoretical values, numerical modeling from the literature, and data from commercial electromagnetic simulators. The method has been also applied to the accurate determination of dielectric properties, and we provide an example of these measurements as another way to validate this new method.
Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
60
Issue
9

Keywords

Circuit analysis, dielectric measurements, dielectric resonator, dielectric-loaded waveguides, electromagnetic modeling, microwave filter, mode matching (MM).

Citation

Penaranda-foix, F. , Janezic, M. , Catala-Civera, J. and Canos-Marin, A. (2012), Full-Wave Analysis of Dielectric-Loaded Cylindrical Waveguides and Cavities Using a New Four-Port Ring Network, IEEE Transactions on Microwave Theory and Techniques, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907688 (Accessed December 26, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 30, 2012, Updated October 12, 2021