Ginley, R.
(2011),
NIST’s High Frequency Metrology Programs: Current Capabilities and Future Directions, Symposium of Metrology, CENAM, 2010, Queretaro, Mexico, Queretaro, -1
(Accessed March 13, 2025)
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NISTs High Frequency Metrology Programs: Current Capabilities and Future Directions
Published
Author(s)
Abstract
There are several core areas that are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameters (s-parameters), field strength and antenna parameters. The rapid change in technology and the current economic conditions have made us re-examine our services and to make changes where necessary. In this paper we will examine the current state of the microwave measurement services at NIST, discuss what changes are happening to those services and then give a glimpse at the future directions for the programs.Proceedings Title
Symposium of Metrology, CENAM, 2010, Queretaro, Mexico
Volume
6
Issue
1
Conference Dates
October 27-29, 2010
Conference Location
Queretaro
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created March 31, 2011, Updated February 19, 2017