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Chris Long (Fed)
Dr. Christian J. Long is the project leader for the Radio-Frequency Power and Impedance project at the National Institute of Standards and Technology (NIST). Dr. Long received the B.S. and Ph.D. degrees in physics from the University of Maryland at College Park, College Park, MD, USA, in 2004 and 2011, respectively. His doctoral research focused on development of both near-field scanning probe microscopy techniques and new methods to analyze data from combinatorial materials experiments. From 2012 to 2015 he was a postdoctoral research fellow with NIST, Gaithersburg, USA, where he focused on techniques for characterizing nanoscale materials. In 2016, he joined the staff at NIST, Boulder, USA, to work on development of standards for radio-frequency, microwave, and mm-wave calibrations.
Selected Publications:
- Energy harvesting properties of all-thin-film multiferroic cantilevers, T.-D. Onuta, Y. Wang, C. J. Long, and I. Takeuchi, Applied Physics Letters 99, 203506 (2011).
- Atomic resolution imaging at 2.5 GHz using near-field microwave microscopy, J. Lee, C. J. Long, H. Yang, X.-D. Xiang, and I. Takeuchi, Applied Physics Letters 97, 183111 (2010).
- Rapid identification of structural phases in combinatorial thin-film libraries using x-ray diffraction and non-negative matrix factorization, C. J. Long, D. Bunker, X. Li, V. L. Karen, and I. Takeuchi, Review of Scientific Instruments 80, 103902 (2009).
