Evgheni Strelcov is a Physicist in the Advanced Electronics Group in the Nanoscale Device Characterization Division since 2015. He received B.S. and M.S. degrees in Inorganic Chemistry from Moldova State University, Moldova, and Ph.D. in Applied Physics from Southern Illinois University at Carbondale. His research interests include: advanced scanning probe microscopy; probing nanoscale charge transport and concurrent electrochemical and structural transformations in complex oxides; in situ and operando scanning probe and electron spectroscopy and microscopy of nanodevices; nanostructure-based metal-oxide gas sensors; nanostructure growth; complex compounds of 3d and 4f elements. Evgheni is working on developing metrology for probing charge transport and defect structure in wide band gap semiconductor materials and power electronics devices, as well as metrology for electronic device packaging operating at extreme temperatures.