Nate Orloff (Fed)

Nate Orloff is a physicist at the National Institute of Standards and Technology (NIST) and an Adjunct Faculty of the University of Colorado.  Nate’s interested in materials properties from dc to daylight, and what we can do with them.  He received a Ph.D. degree from the University of Maryland in 2010.  After postdoctoral appointments at Stanford University and then Rice University, Nate joined the Communications Technology Laboratory in 2014.  Nate’s research spans the broad topic of on-wafer measurement science from 10 Hz to 1 THz.  Selected topics include new standard reference instruments for 5G and beyond, developing the next generation of network analysis with optical frequency combs, and leveraging materials-by-design to build enabling communication technology.  If you are interested in collaborating or working with Nate please feel free to email him at orloff [at] nist.gov (orloff[at]nist[dot]gov)
 

Research Topics:

• On-wafer standards
• Dielectric spectroscopy
• On-wafer devices

Postdoctoral and Graduate Research Opportunities and Topics

• 5G Advanced Microwave Materials for Millimeter-wave Devices http://nrc58.nas.edu/RAPLab10/Opportunity/Opportunity.aspx?LabCode=50&ROPCD=506722&RONum=B8282
• A full list of opportunities can be found here: http://nrc58.nas.edu/RAPLab10/Opportunity/SearchProgram.aspx?LabCode=50…

Selected Publications

• Google scholar link: https://scholar.google.com/citations?user=da_MxXcAAAAJ&hl=en
• Das, S.; et al. Local Negative Permittivity and Topological Phase Transition in Polar Skyrmions. Nat. Mater. 2020, 1–8. https://doi.org/10.1038/s41563-020-00818-y.
• Dawley, N. M.; et al. Targeted Chemical Pressure Yields Tuneable Millimetre-Wave Dielectric. Nat. Mater. 2019, 1–6. https://doi.org/10.1038/s41563-019-0564-4.
• Stelson, A. C.; et al. Label-Free Detection of Conformational Changes in Switchable DNA Nanostructures with Microwave Microfluidics. Nat. Commun. 2019, 10. https://doi.org/10.1038/s41467-019-09017-z.
• Hagerstrom, A. M.; et al. Measurements of Nonlinear Polarization Dynamics in the Tens of Gigahertz. Phys. Rev. Appl. 2020, 13 (4), 044026. https://doi.org/10.1103/PhysRevApplied.13.044026.
• Lee, C.-H.; Orloff, N. D.; Birol, T.; et al. Exploiting Dimensionality and Defect Mitigation to Create Tunable Microwave Dielectrics. Nature 2013, 502 (7472), 532–536. https://doi.org/10.1038/nature12582.

Selected Awards and Honors

• Department of Commerce Bronze Medal, 2020
• American Ceramic Society Karl Schwartzwalder-Professional Achievement in Ceramic Engineering (PACE) Award, 2019
• Senior member IEEE Society of Microwave Theory and Techniques, 2017
• Best Speaker Award, Materials Research Society Materials Research Society. Symposium K: Oxide Nanoelectronics, 2009

Selected Professional Service

• American Ceramic Society Electronics Division Committee, Corporate Relations Chair.
• American Physical Society Member-At-Large for the Fellowship of Industrial and Applied Physicists
• Institute of Electrical and Electronics Engineers, Technical Program Committee for the International Microwave Symposium

Selected Funding

• 2020 Innovation in Measurement Science Grant. Measuring intermolecular interactions with electric-acoustic spectroscopy, National Institute of Standards and Technology. Total award: $7,000,000
• 2017 Innovation in Measurement Science. DC to 1 THz Large-Amplitude Optoelectronic Multitone Electrical-Signal Synthesizer, National Institute of Standards and Technology. Total award: $7,650,000.
• 2016 Tailorable Composite Feedstock and Forming Project. Defense Advanced Research Projects Agency. Total award: $780,000.

Patents

• N. D. Orloff, C. J. Long, and J. Obrzut “Noncontact resonameter, process for making and use of same,” U.S. Patent No. 14/958,539.
• C. J. Long, N. D. Orloff, E. J. Garboczi, and N. B. Popovic, “Scanning Microwave Ellipsometry, Process for Making and Use of Same,” U.S. Patent Application Number 16/864,466 (filed 5/1/2020). Under review at USPTO.