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Update on DMIS Certification

Author(s)
William G. Rippey
The Dimensional Standards Consortium (DMSC) and the National Institute of Standards and Technology (NIST) announced the rollout of the DMSC's DMIS Certification...

First approaches to standard protocols and reference materials for the assessment of potential hazards associated with nanomaterials

Author(s)
Iseult Lynch, Hans Bouwmeester, Hans Marvin, Alan Casey, Gordon Chambers, Markus Berges, Martin Clift, Teresa Fernandes, Lise Fjellsbo, Lucienne Juillerat, Gert Roebben, Christoph Klein, Qinglan Wu, Vincent A. Hackley, Jean-Pierre Kaiser, Wolfgang Kreyling, C. Michael Garner, Peter Hatto, Kenneth Dawson, Michael Riediker
This report presents the outcome of the discussions of 60 experts in the field of safety assessment of manufactured NMs from academia, industry, government and...

Clathrate Hydrate Physical Property Database

Author(s)
Kenneth G. Kroenlein, Chris D. Muzny, Andrei F. Kazakov, Vladimir Diky, Robert D. Chirico, E. D. Sloan, Michael D. Frenkel
To facilitate advances in application of technologies pertaining to gas hydrates, a database containing experimentally-derived information about those materials...

Overview of the TAC 2008 Update Summarization Task

Author(s)
Hoa T. Dang, Karolina K. Owczarzak
The summarization track at the Text Analysis Conference (TAC) is a direct continuation of the Document Understanding Conference (DUC) series of workshops...

A VVSG-derived model of election data

Author(s)
David W. Flater
An effort to define a common data format for voting systems should begin with a data model that specifies the relevant concepts. To accelerate adoption and...

Performance of a Nanopositioner Controller Filter Compensator

Author(s)
Donna Le, Nicholas Dagalakis, Jason J. Gorman, Jae M. Yoo
We describe the use of appropriate type simple resistor and capacitor (RC) compensators, which properly connected to a power amplifier, can improve the dynamic...

NIST s Integrated Colony Enumerator (NICE)

Author(s)
Matthew L. Clarke, Jeeseong Hwang
Enumeration of bacterial colonies in an agar plate is simple in concept, but automated colony counting is difficult due to variations in colony color, size...

DSQAP Exercise C Report

Author(s)
Catherine A. Rimmer, Laura J. Wood, Katrice A. Lippa, Melissa M. Phillips

Mobile Device Forensics - Tool Testing

Author(s)
Richard Ayers
The goal of the Computer Forensic Tool Testing (CFTT) project at the National Institute of Standards and Technology (NIST) is to establish a methodology for...

Non-GSM Mobile Device Tool Specification

Author(s)
Richard Ayers
As mobile devices proliferate, incorporating a host of integrated features and capabilities, their use can be seen everywhere in our world today. Mobile...

2nd Annual Tri-National Workshop on Standards for Nanotechnology - (NIST presentations)

Author(s)
Ronald G. Dixson, Jon R. Pratt, Vincent A. Hackley, James E. Potzick, Richard A. Allen, Ndubuisi G. Orji, Michael T. Postek, Herbert S. Bennett, Theodore V. Vorburger, Jeffrey A. Fagan, Robert L. Watters
A new era of cooperation between North American National Measurement Institutes (NMIs) was ushered by the National Research Council of Canada Institute for...

Proprietary Design Information and Fruit Pies

Author(s)
John A. Horst
The proliferation of proprietary design info exchange formats is causing high costs to manufacturers. The standards solution is offered as both attainable and...

The NIST Standards in Trade Program

Author(s)
P L. Heydemann
Plans, organizes, and manages the placement of technical experts from NIST, or selected by NIST, in key U.S. embassies and missions to provide technical advice...

Diagnosis of Pulsed Squeezing in Multiple Temporal Modes

Author(s)
Scott C. Glancy, Emanuel H. Knill, Thomas Gerrits, Tracy S. Clement, Martin J. Stevens, Sae Woo Nam, Richard P. Mirin
When one makes squeezed light by downconversion of a pulsed pump laser, many temporal / spectral modes are simultaneously squeezed by different amounts. There...

Environmental Trends Affecting Electronics Manufacturing

Author(s)
Eric D. Simmon, John V. Messina, Matthew L. Aronoff, Michael Cox
Companies that in the recent past were primarily concerned with satisfying environmental regulations are finding that environmental responsibility and...
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