Tang, Y.
and Wood, B.
(2008),
Comparison of the NIST and NRC Josephson Voltage Standards (SIM.EM.BIPM-K10.b), BIPM Key Comparison database (KCDB), [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32984, http://kcdb.bipm.org/
(Accessed October 31, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Comparison of the NIST and NRC Josephson Voltage Standards (SIM.EM.BIPM-K10.b)
Published
Author(s)
, Barry Wood
Abstract
A comparison between the National Institute of Standards and Technology (NIST) and the National Research Council (NRC) Josephson Voltage Standards (JVS) was carried out at NRC from August 13 to August 17, 2007. The comparison was made at the 10 V level. It was a two-way direct JVS comparison, which means that the NIST JVS provided a voltage at 10 V and was measured against the NRC JVS with NRC's measuring system (hardware and software). The comparison was repeated by using the NIST JVS measuring system to measure a voltage at 10 V provided by the NRC JVS. The results from the two comparisons were consistent. The difference between the NIST CJVS and the NRC JVS is -0.28 nV with an expanded uncertainty (k = 2) 2.07 nV at 10 V or 2.07 parts in 10^10.Citation
BIPM Key Comparison database (KCDB)
Volume
45
Pub Weblink
Pub Type
Websites
Download Paper
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created July 1, 2008, Updated February 17, 2017