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PUBLICATIONS

Application of Microcalorimeter EDS X-Ray Detectors to Particle Analysis

Published

Author(s)

Alain C. Diebold, David A. Wollman, Kent D. Irwin, John M. Martinis, B. H. Liu
Proceedings Title
Proc., Fourth Intl. Symp. on Ultra Clean Processing of Silicon Surfaces (UCPSS'98)
Conference Dates
September 21-23, 2098
Conference Location
Ostend, 1, SW
Pub Type
Conferences
Sensors

Citation

Diebold, A. , Wollman, D. , Irwin, K. , Martinis, J. and Liu, B. (1998), Application of Microcalorimeter EDS X-Ray Detectors to Particle Analysis, Proc., Fourth Intl. Symp. on Ultra Clean Processing of Silicon Surfaces (UCPSS'98), Ostend, 1, SW (Accessed October 31, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 31, 1998, Updated October 12, 2021