Weidman, M.
(1973),
Application of a non-ideal sliding short to two-port loss measurement:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.TN.644
(Accessed January 13, 2025)
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Application of a non-ideal sliding short to two-port loss measurement:
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Author(s)
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- NBS TN 644
Report Number
NBS TN 644
Pub Type
NIST Pubs
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Created January 1, 1973, Updated May 19, 2023