Berning, D.
(1991),
An Automated Reverse-Bias Second-Breakdown Transistor Tester, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed July 20, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
An Automated Reverse-Bias Second-Breakdown Transistor Tester
Published
Author(s)
Citation
Journal of Research (NIST JRES) -
Volume
96
Issue
3
NIST Pub Series
Pub Type
NIST Pubs
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created June 1, 1991, Updated February 17, 2017