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An Automated System for the Measurement of High-Valued Resistors

Published

Author(s)

Paul A. Boynton
Proceedings Title
Proc. National Conference of Standards Laboratories Workshop and Symposium (NCSL)
Conference Dates
August 2-6, 1992
Conference Location
Washington, DC

Citation

Boynton, P. (1992), An Automated System for the Measurement of High-Valued Resistors, Proc. National Conference of Standards Laboratories Workshop and Symposium (NCSL), Washington, DC, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=12853 (Accessed October 31, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 1, 1992, Updated February 19, 2017